Low Temperature Physics: 32, 1078 (2006); https://doi.org/10.1063/1.2389016 (4 pages)
Физика Низких Температур: Том 32, Выпуск 11 (Ноябрь 2006), c. 1417-1421 ( к оглавлению , назад )
Oxygen-driven relaxation processes in pre-irradiated Ar cryocrystals
E.V. Savchenko1, A.G. Belov1, G.B. Gumenchuk1, A.N. Ponomaryov2, and V.E. Bondybey2,3
1B. Verkin Institute for Low Temperature Physics and Engineering of the National Academy of Sciences of Ukraine, 47 Lenin Ave., Kharkov 61103, Ukraine
2Institut für Physikalische und Theoretische Chemie, TU München, Lichtenbergstr, 4, Garching 85747, Germany
3University of California, Irvine 92697, USA
Received September 13, 2006
Relaxation processes in oxygen-containing Ar cryocrystals pre-irradiated by low-energy electrons
are studied with the focus on the role of diffusion controlled atom-atom recombination reaction of oxygen in the relaxation cascades. The results of correlated in real time measurements of thermally stimulated phenomena are presented. The experiments have been performed using activation spectroscopy methods — thermally stimulated exoelectron emission and spectrally resolved thermally stimulated luminescence. Solid evidence of the radiative mechanism of electron detrapping triggering the relaxation cascades is obtained.
Ключевые слова: thermally stimulated luminescence, thermally stimulated exoelectron emission, relaxation processes, radiation effects, radical recombination, cryocrystals.