Occupation preference values in doped CmIm' multinaries from EXAFS and FTIR correlative analysis
B.V. Robouch and A. Marcelli
Istituto Nazionale di Fisica Nucleare-Laboratori Nazionali di Frascati, Via Enrico Fermi 40, I-00044 Frascati, Italy
European Commission, Joint Research Centre, Institute for Reference Materials and Measurements Retieseweg 111, 2440 Geel, Belgium
Instytut Fizyki, Universytet Jagiellonski, Reymonta 4, 30-059 Krakow, Poland
Received September 24, 2010
We discuss which x-ray absorption fine structure (EXAFS) data of binary doped CmIm' compound structures can be unfolded to determine elemental bond distances and the deviations from random configurations due to site preference occupations (SOPs). SOP-deviation estimations can be further confirmed by independent Fourier
transform infrared (FTIR) data analysis. The limits and restrictions of our model are presented and discussed.