Low Temperature Physics: 43, 290 (2017); https://doi.org/10.1063/1.4976636
Физика Низких Температур: Том 43, Выпуск 2 (Февраль 2017), c. 353-359 ( к оглавлению , назад )
On the nature of ionic liquid gating of Nd2–xCexCuO4 thin films
Hasan Atesci1, Francesco Coneri2, Maarten Leeuwenhoek1, Hans Hilgenkamp2, and Jan M. van Ruitenbeek1
1Huygens-Kamerlingh Onnes Laboratorium, Universiteit Leiden, Postbus 9504, 2300 RA Leiden, The Netherlands
2MESA+ Institute for Nanotechnology, University of Twente P.O. Box 217, 7500 AE Enschede, The Netherlands
Received August 19, 2016
Recently, ionic liquid gating has been used to modulate the charge carrier properties of metal oxides. The mechanism behind it, however, is still a matter of debate. In this paper, we report experiments on doped and undoped Nd2–xCexCuO4. We find major resistance drops of the bilayer coupled to observations of the presence of a considerable Faradeic component in the gate current and of the appearance of charge transfer peaks in the cyclic voltammetry data. This leads us to propose a mechanism of gating based on irreversible electrochemical reactions, likely due to trace amounts of contaminations present in the ionic liquid. This work is therefore in line with previous reports confirming the presence of irreversible electrochemistry in ionic liquid gated electron-doped cuprates.
PACS: 66.10.–x Diffusion and ionic conduction in liquids;
Ключевые слова: Nd2–xCexCuO4, ionic liquid, conductance, electrochemistry, nanoionics.
Published online: December 26, 2016